Research area 04
Scientific Machine Learning
Surrogate models and data-driven workflows that make semiconductor design exploration faster.
Motivation
Physics-based simulations can resolve electric fields, radiation transport and transient charge collection in great detail, but a large design sweep may require many expensive runs. Scientific machine learning can learn relationships between design variables and simulation outputs, allowing promising regions to be explored more efficiently.
This is a developing research direction within The Open Notebook. The aim is to complement physical simulation—not replace it.
From simulation data to surrogate models
A workflow begins with a carefully designed set of TCAD or particle-transport simulations. Inputs may include geometry, materials, doping, bias and radiation conditions. Outputs may include field metrics, breakdown indicators, deposited energy, peak current, collected charge, collection time and response uniformity.
A surrogate model is trained on these results and evaluated on unseen simulations. Once validated, it can estimate responses quickly enough for sensitivity studies, optimization and uncertainty analysis.
Research questions
- Which design variables control detector response most strongly?
- How many simulations are needed before a surrogate becomes reliable?
- How should physical constraints and known scaling laws be included?
- How can uncertainty be reported so that a fast prediction is not mistaken for a verified device result?
- Can active learning select the next simulation that is most informative?
Methods under exploration
- Regression baselines and response-surface models
- Gaussian-process surrogates with uncertainty estimates
- Tree-based ensemble methods
- Neural-network models for higher-dimensional data
- Sensitivity analysis and feature importance
- Bayesian optimization and active learning
- Physics-informed features and constrained predictions
Principles
- Physics first: models should respect governing physics, symmetry and limiting behaviour
- Validation beyond a random split: test new regions and physically meaningful edge cases
- Uncertainty is part of the result: show where new high-fidelity simulation is required
- Reproducible workflows: use structured datasets, versioned notebooks and clear metadata
Intended outcomes
- Faster screening of detector designs
- Identification of dominant physical parameters
- More efficient allocation of high-fidelity simulations
- Compact models for design exploration
- Open teaching examples connecting semiconductor physics, statistics and machine learning
The long-term goal is a transparent loop in which simulation generates knowledge, machine learning guides exploration and physics provides the final test.